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TC74HC07AP/AF
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74HC07AP,TC74HC07AF
Hex Buffer (open drain)
The TC74HC07A is a high speed CMOS BUFFER fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. Pin configuration and function are the same as the TC74HCT7007A. But the TC74HC07A has high performance MOS N-channel transistor (open-drain) outputs. This device can, therfore, with a suitable pull-up resistors, be used in wired-AND, LED driver and other applications. All inputs are equipped with protection circuits against static discharge or transient excess voltage.
TC74HC07AP
TC74HC07AF
Features
* * * * * * * High speed: tpz = 5 ns (typ.) at VCC = 5 V Low power dissipation: ICC = 1 A (max) at Ta = 25C High noise immunity: VNIH = VNIL = 28% VCC (min) Output drive capability: 10 LSTTL loads Wide operating voltage range: VCC (opr) = 2 to 6 V Open drain structure. Pin and function compatible with 74LS07 Weight DIP14-P-300-2.54 SOP14-P-300-1.27A : 0.96 g (typ.) : 0.18 g (typ.)
Pin Assignment
IEC Logic Symbol
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TC74HC07AP/AF
Truth Table
A L H Y L Z
Z: High impedance
System Diagram (per gate)
Absolute Maximum Ratings (Note 1)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5 to 7 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 20 20 +25 50 500 (DIP) (Note 2)/180 (SOP) -65 to 150 Unit V V V mA mA mA mA mW C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = -40 to 65C. From Ta = 65 to 85C a derating factor of -10 mW/C shall be applied until 300 mW.
Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VCC VIN VOUT Topr Rating 2 to 6 0 to VCC 0 to VCC -40 to 85 0 to 1000 (VCC = 2.0 V) Input rise and fall time tr, tf 0 to 500 (VCC = 4.5 V) 0 to 400 (VCC = 6.0 V) ns Unit V V V C
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
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Electrical Characteristics
DC Characteristics
Test Condition Characteristics Symbol VCC (V) 2.0 High-level input voltage VIH 4.5 6.0 2.0 Low-level input voltage VIL 4.5 6.0 2.0 IOL = 20 A Low-level output voltage VOL VIN = VIL IOL = 4 mA IOL = 5.2 mA Output off-state current Input leakage current Quiescent supply current IOZ IIN ICC VIN = VIH or VIL VOUT = VCC VIN = VCC or GND VIN = VCC or GND 4.5 6.0 4.5 6.0 6.0 6.0 6.0 Min 1.50 3.15 4.20 Ta = 25C Typ. 0.0 0.0 0.0 0.17 0.18 Max 0.50 1.35 1.80 0.1 0.1 0.1 0.26 0.26 0.5 0.1 1.0 Ta = -40 to 85C Min 1.50 3.15 4.20 Max 0.50 1.35 1.80 0.1 0.1 0.1 0.33 0.33 5.0 1.0 10.0 A A A V V V Unit
AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25C, input: tr = tf = 6 ns)
Characteristics Output transition time Propagation delay time Propagation delay time Symbol tTHL tpLZ tpZL RL = 1 k RL = 1 k Test Condition Min Typ. 4 5 5 Max 8 15 15 Unit ns ns ns
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AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns)
Test Condition Characteristics Symbol VCC (V) 2.0 Output transition time tTHL 4.5 6.0 2.0 Propagation delay time tpLZ RL = 1 k 4.5 6.0 2.0 Propagation delay time Input capacitance Output capacitance Power dissipation capacitance tpZL CIN COUT CPD (Note) RL = 1 k 4.5 6.0 Min Ta = 25C Typ. 30 8 7 10 7 6 17 7 5 5 3 4 Max 75 15 13 90 18 15 90 18 15 10 Ta = -40 to 85C Min Max 95 19 16 115 23 20 115 23 20 10 pF pF pF ns ns ns Unit
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC/6 (per gate)
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TC74HC07AP/AF
Package Dimensions
Weight: 0.96 g (typ.)
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TC74HC07AP/AF
Package Dimensions
Weight: 0.18 g (typ.)
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TC74HC07AP/AF
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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